2D-carrier profiling in narrow quantum wells by a Schottky’s current transport model based on scanning spreading resistance microscopy

HUANG Wen-Chao; WANG Xiao-Fang; CHEN Xiao-Shuang; XUE Yu-Xiong; YANG Sheng-Sheng

doi:10.11972/j.issn.1001-9014.2018.06.005

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