[1] Betti R, Hurricane O A. Inertial-confinement fusion with lasers [J]. Nature Physics, 2016, 12(5): 43548.
[2] Lindl J D, Amendt P, Berger R L, et al. The physics basis for ignition using indirect-drive targets on the National Ignition Facility [J]. Physics of Plasmas, 2004, 11(2): 33991.
[3] Robey H F, Boehly T R, Celliers P M, et al. Shock timing experiments on the National Ignition Facility: Initial results and comparison with simulation [J]. Physics of Plasmas, 2012, 19(4): 042706.
[4] Shu H, Fu S Z, Huang X G, et al. Shock-timing experiments in polystyrene target [J]. Chinese Optics Letters, 2010, 8(12): 1142-1143.
[6] Postava K, Maziewski A, Yamaguchi T, et al. Null ellipsometer with phase modulation [J]. Optics Express, 2004, 12(24): 6040-6045.
[7] Alfonso E L, Clark A A, Steinman D A, et al. Techniques to measure the refractive index of GDP and Ge-doped GDP with monochromatic light [J]. Fusion Science and Technology, 2011, 59(1): 116-120.
[8] Arosa Y, López-Lago E, De La Fuente R. Refractive index retrieval in the UV range using white light spectral interferometry [J]. Optical Materials, 2018, 82: 88-92.
[9] Arosa Y, López-Lago E, De La Fuente R. Refractive index measurements in absorbing media with white light spectral interferometry [J]. Optics Express, 2018, 2(6): 7578-7579.
[10] Guo T, Chen Z, Li M H, et al. Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer [J]. Applied Optics, 2018, 57(12): 2955-2961.
[11] Park J, Bae J, Kim J A, et al. Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry [J]. Optics Communications, 2019, 431: 181-186.
[12] Kitsara M, Petrou P, Kontziampasis D, et al. Biomolecular layer thickness evaluation using white light reflectance spectroscopy [J]. Microelectronic Engineering, 2010, 87: 802-805.
[13] Li N J, Gao F, Zhang S. Thin-film thickness measurement method based on the reflection interference spectrum [C]. Proceedings of SPIE, 2012: 84150.
[14] Phan N N, Le H H, Duong D C, et al. Measurement of nanoscale displacements using a Mirau white-light interference microscope and an inclined flat surface [J]. Optical Engineering, 2019, 58(6): 064106.
[18] Weber M J. Handbook of Optical Materials [M]. CRC Press, 2003.