Plasmonic triple-wavelength demultiplexing structure based on metal-insulator-metal waveguides side-coupled with nanoring cavities

Xu Siyu; Zhang Zhaojian; He Xin; Han Yunxin; Zhang Jingjing; Huang Jie; Chen Dingbo; Yang Junbo

doi:10.3788/irla201948.0221001

[1] Liu H, Gao Y, Zhu B, et al. A T-shaped high resolution plasmonic demultiplexer based on perturbations of two nanoresonators[J]. Opt Commun, 2015, 334: 164-169.

[2] Neutens P, Dorpe P V, Vlaminck I D, et al. Elec-trical detection of confined gap plasmons in metal-insulator-metal waveg-uides[J]. Nat Photon, 2009, 3: 283-286.

[3] Zhu Zhendong, Bai Benfeng, Tan Qiaofeng. Resonance characteristics of surface plasmon elements on laminated cylindrical table [J]. Infrared and Laser Engineering, 2017, 46(9): 0934001. (in Chinese)

[4] Zhu Mengjun, Zhang Dawei, Chen Jiannong. Design of broadband near-infrared surface plasmon logic and gate devices[J]. Infrared and Laser Engineering, 2016, 45(3): 0320003.(in Chinese)

[5] Dionne J A, Sweatlock L A, Atwater H A. Plasmon slot waveguides: Towards chip-scale propagation with subwavelength-scale localization[J]. Phys Rev B, 2006, 73: 035407.

[6] Johnson P B, Christy R W. Optical constants of the noble metals[J]. Phys Rev B, 1972, 6: 4370-4379.

[7] Li Q, Wang T, Su Y, et al. Coupled mode theory analysis of mode-splitting in coupled cavity system[J]. Opt Exp, 2010, 18: 8367-8382.

[8] Wang G, Lu H, Liu X, et al. Tunable multi-channel wavelength demultiplexer based on MIM plasmonic nanodisk resonators at telecommunication regime[J]. Opt Exp, 2011, 19: 3513-3518.

[9] Chremmos I. Magnetic field integral equation analysis of interactionbetween a surface plasmon polariton and a circular dielectric cavity embedded in the metal[J]. J Opt Soc Amer A, 2009, 26: 2623-2633.

[10] Hu F, Yi H, Zhou Z. Wavelength demultiplexing structure based on arrayed plasmonic slot cavities[J]. Opt Lett, 2011, 36: 1500-1502.

[11] Huang Lingling. Phase control characteristics and applications of the metamaterials based on chiral light field[J]. Infrared and Laser Engineering, 2016, 45(6): 0634001. (in Chinese)