Researching | Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments

Journals >High Power Laser Science and Engineering >Volume 6 >Issue 1 >Page 010000e3 > Article

High Power Laser Science and Engineering
Vol. 6, Issue 1, 010000e3 (2018)

Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments

Ruirong Wang^†, Honghai An, Zhiyong Xie, and Wei Wang

Author Affiliations

Shanghai Institute of Laser Plasma, Shanghai 201800, China

show less

DOI: 10.1017/hpl.2017.33 Cite this Article Set citation alerts

Ruirong Wang, Honghai An, Zhiyong Xie, Wei Wang. Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments[J]. High Power Laser Science and Engineering, 2018, 6(1): 010000e3 Copy Citation Text

show less

References

[1] E. Amarachukwu, N. Martin, Uk. J. Young, G. B. Anarii, C. T. David. J. Appl. Phys., 113, 014907(2013).

[2] M. H. Edwards, D. Whittaker, P. Mistry, N. Booth, G. J. Pert, G. J. Tallents, B. Rus, T. Mocek, M. Koslová, C. McKenna, A. Delserieys, C. L. S. Lewis, M. Notley, D. Neely. Phys. Rev. Lett., 97, 035001(2006).

[3] G. Boutoux, D. Batani, F. Burgy, J.-E. Ducret, P. Forestier-Colleoni, S. Hulin, N. Rabhi, A. Duval, L. Lecherbourg, C. Reverdin, K. Jakubowska, C. I. Szabo, S. Bastiani-Ceccotti, F. Consoli, A. Curcio, R. De Angelis, F. Ingenito, J. Baggio, D. Raffestin. Rev. Sci. Instrum., 87, 043108(2016).

[4] L. B. Da Silva, B. J. MacGowan, D. R. Kania, B. A. Hammel, C. A. Back, E. Hsieh, R. Doyas, C. A. Iglesias, F. J. Rogers, R. W. Lee. Phys. Rev. Lett., 69, 438(1992).

[5] C. Reverdin, F. Thais, G. Loisel, M. Busquet, S. Bastiani-Ceccotti, T. Blenski, T. Caillaud, J. E. Ducret, W. Foelsner, D. Gilles, F. Gilleron, J. C. Pain, M. Poirier, F. Serres, V. Silvert, G. Soullie, S. Turck-Chieze, B. Villette. Rev. Sci. Instrum., 83, 10E134(2012).

[6] Z. Yang, J. M. Yang, J. A. Zhang, J. S. Liu, X. Yuan, F. T. Jin. Rev. Sci. Instrum., 80, 043505(2009).

[7] P. W. Lake, J. L. Bailey, G. A. Rochau, P. Gard, D. Petmecky, M. Bump, N. R. Joseph, T. C. Moore, L. B. Nielsen-Weber. Rev. Sci. Instrum., 77, 10F315(2006).

[8] P. F. Knapp, S. A. Pikuz, T. A. Shelkovenko, D. A. Hammer, S. B. Hansen. Phys. Plasmas, 19, 056302(2012).

[9] A. D. Cahill, C. L. Hoyt, S. A. Pikuz, T. Shelkovenko, D. A. Hammer. Rev. Sci. Instrum., 85, 103114(2014).

[10] J. E. Bailey, G. A. Rochau, R. C. Mancini, C. A. Iglesias, J. J. MacFarlane, I. E. Golovkin, C. Blancard, Ph. Cosse, G. Faussurier. Phys. Plasmas, 16, 058101(2009).

[11] R.-R. Wang, W.-M. Chen, W. Wang. Opt. Prec. Eng., 18, 1303(2010).

[12] B. L. Henke, P. A. Jaanimagi. Rev. Sci. Instrum., 56, 1537(1985).

[13] R.-R. Wang, W. Wang, C. Wang, J.-Q. Dong, J.-R. Sun, B.-G. Wan. Acta Phys. Sin., 52, 556(2003).

[14] B. L. Henke, H. T. Yamada, T. J. Tanaka. Rev. Sci. Instrum., 54, 1311(1983).

[15] J.-Y. Zhang, J.-M. Yang, Y. Xu, G.-H. Yang, J. Yan, G.-W. Meng, Y.-N. Ding, Y. Wang. Acta Phys. Sin., 57, 688(2008).

[16] A. L. Meadowcroft, C. D. Bentley, E. N. Sotott. Rev. Sci. Instrum., 79, 113102(2008).

[17] B. R. Maddox, H. S. Park, B. A. Remington, N. Izumi, S. Chen, C. Chen, G. Kimminau, Z. Ali, M. J. Haugh, Q. Ma. Rev. Sci. Instrum., 82, 023111(2011).

[18] J. Bruneau, A. Decoster, D. Desenne, H. Dumont, J. P. Breton, M. Boivineau, J. P. Perrine, S. Bayle, H. Louis-Jacquet, J. P. Geindre, C. Chenais-Popvics, J. C. Gauthier. Phys. Rev. A, 44, R832(1991).

[19] L. DaSilva, A. Ng, B. K. Godwal, G. Chiu, F. Cottet, M. C. Richardson, P. A. Jaanimagi, Y. T. Lee. Phys. Rev. Lett., 62, 1623(1989).

Figures&Tables (7)

References (19)

Copy Citation Text

Ruirong Wang, Honghai An, Zhiyong Xie, Wei Wang. Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments[J]. High Power Laser Science and Engineering, 2018, 6(1): 010000e3

Download Citation

Set citation alerts for the article

Set citation alerts for the article

Save the article for my favorites

Paper Information

Recommended Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology

Set citation alerts for the article

Please enter your email address