Non-uniformity correction technique for amorphous silicon flat-panel detector

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 32 >Issue 8 >Page 36 > Article

Opto-Electronic Engineering
Vol. 32, Issue 8, 36 (2005)

Non-uniformity correction technique for amorphous silicon flat-panel detector

[in Chinese]^1、2, [in Chinese]³, and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. Non-uniformity correction technique for amorphous silicon flat-panel detector[J]. Opto-Electronic Engineering, 2005, 32(8): 36 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese]. Non-uniformity correction technique for amorphous silicon flat-panel detector[J]. Opto-Electronic Engineering, 2005, 32(8): 36

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