• Acta Optica Sinica
  • Vol. 39, Issue 11, 1113001 (2019)
Xuemeng Xu, Pengfei Zheng, Jing Li, Hong Hong, Huimin Yang, Ruohu Zhang, and Binfeng Yun*
Author Affiliations
  • Advanced Photonics Center, Southeast University, Nanjing, Jiangsu 210096, China
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    DOI: 10.3788/AOS201939.1113001 Cite this Article Set citation alerts
    Xuemeng Xu, Pengfei Zheng, Jing Li, Hong Hong, Huimin Yang, Ruohu Zhang, Binfeng Yun. Delay Test of Tunable Silicon Nitride Micro-Ring Based on Optical Vector-Network Analysis[J]. Acta Optica Sinica, 2019, 39(11): 1113001 Copy Citation Text show less
    Schematic of OVNA measurement system based on optical single sideband modulation
    Fig. 1. Schematic of OVNA measurement system based on optical single sideband modulation
    Schematic of tunable silicon nitride micro-ring
    Fig. 2. Schematic of tunable silicon nitride micro-ring
    Variation between measured delay and average delay of OVNA system
    Fig. 3. Variation between measured delay and average delay of OVNA system
    Test of resonance peak deviation. (a) Micro-ring delay spectra of multiple measurements; (b) resonance frequency fluctuation of 20 measurements
    Fig. 4. Test of resonance peak deviation. (a) Micro-ring delay spectra of multiple measurements; (b) resonance frequency fluctuation of 20 measurements
    Comparison between delay spectrum of single measurement and average delay spectrum of 20 measurements
    Fig. 5. Comparison between delay spectrum of single measurement and average delay spectrum of 20 measurements
    Comparison of delay spectra after frequency-domain alignment. (a) Delay spectra of multiple measurements; (b) delay spectrum of single measurement, average delay spectrum of 20 measurements, and average delay spectrum of 20 measurements after frequency-domain alignment
    Fig. 6. Comparison of delay spectra after frequency-domain alignment. (a) Delay spectra of multiple measurements; (b) delay spectrum of single measurement, average delay spectrum of 20 measurements, and average delay spectrum of 20 measurements after frequency-domain alignment
    Measurement and fitting for micro-ring amplitude spectra. (a) Micro-ring amplitude spectra measured by LMS and OVNA; (b) fitting of micro-ring transmission spectrum
    Fig. 7. Measurement and fitting for micro-ring amplitude spectra. (a) Micro-ring amplitude spectra measured by LMS and OVNA; (b) fitting of micro-ring transmission spectrum
    Comparison of delay spectra obtained by OVNA measurement and theoretical fitting
    Fig. 8. Comparison of delay spectra obtained by OVNA measurement and theoretical fitting
    Transmission and delay spectra of micro-ring under different driving voltages. (a) Micro-ring transmission spectra measured by LMS; (b) theoretical fitting delay spectra corresponding to transmission spectra
    Fig. 9. Transmission and delay spectra of micro-ring under different driving voltages. (a) Micro-ring transmission spectra measured by LMS; (b) theoretical fitting delay spectra corresponding to transmission spectra
    Extinction ratio and delay measurement under different driving voltages. (a) Extinction ratio measured by LMS and OVNA; (b) delay obtained by theoretical fitting and OVNA measurement
    Fig. 10. Extinction ratio and delay measurement under different driving voltages. (a) Extinction ratio measured by LMS and OVNA; (b) delay obtained by theoretical fitting and OVNA measurement
    Xuemeng Xu, Pengfei Zheng, Jing Li, Hong Hong, Huimin Yang, Ruohu Zhang, Binfeng Yun. Delay Test of Tunable Silicon Nitride Micro-Ring Based on Optical Vector-Network Analysis[J]. Acta Optica Sinica, 2019, 39(11): 1113001
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