• Spectroscopy and Spectral Analysis
  • Vol. 41, Issue 3, 704 (2021)
GE Liang-quan* and LI Fei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3964/j.issn.1000-0593(2021)03-0704-10 Cite this Article
    GE Liang-quan, LI Fei. Research Advances in In-Situ X-Ray Fluorescence Analysis Technology[J]. Spectroscopy and Spectral Analysis, 2021, 41(3): 704 Copy Citation Text show less

    Abstract

    In-situ X-ray fluorescence analysis technology is an instrumental analysis technology for rapid qualitative and quantitative analysis of elements in the measured object under in-situ working conditions. It is widely used in some fields where large analytical instruments and chemical analysis methods cannot be directly operated. This paper reviews the research progress of in-situ X-ray fluorescence analysis technology in China in the past 20 years. The research progress and main technical characteristics of in-situ X-ray spectrometer are reviewed from the perspectives of in-situ analysis and in-situ sampling analysis. The vital technical problems of in-situ analysis data processing of X-ray spectrum are discussed. The representative applications of X-ray spectrum analysis in the geological survey, environmental pollution investigation, identification of cultural relics and alloy analysis are introduced. The research status and progress of in-situ X-ray spectrometers in the world are evaluated. The potential research directions put forward to make great progress in more application fields.
    GE Liang-quan, LI Fei. Research Advances in In-Situ X-Ray Fluorescence Analysis Technology[J]. Spectroscopy and Spectral Analysis, 2021, 41(3): 704
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