• Laser & Optoelectronics Progress
  • Vol. 59, Issue 17, 1734002 (2022)
Die Qin1、2、*, Yongqian Wu1、**, Yan Xu1, Shuai Zhang1、2, and Ting Deng1、2
Author Affiliations
  • 1Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan , China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/LOP202259.1734002 Cite this Article Set citation alerts
    Die Qin, Yongqian Wu, Yan Xu, Shuai Zhang, Ting Deng. Large Angle Positioning Error Correction for Sub-Aperture Stitching Interferometry of Cylindrical X-Ray Mirrors[J]. Laser & Optoelectronics Progress, 2022, 59(17): 1734002 Copy Citation Text show less
    Schematic diagram of sub-aperture stitching. (a) Stitching of adjacent sub-apertures; (b) sub-aperture mechanical positioning error
    Fig. 1. Schematic diagram of sub-aperture stitching. (a) Stitching of adjacent sub-apertures; (b) sub-aperture mechanical positioning error
    Flow chart of the algorithm
    Fig. 2. Flow chart of the algorithm
    Simulated cylindrical mirror and sub-apertures. (a) Fitting surface of cylindrical mirror; (b) simulated sub-apertures
    Fig. 3. Simulated cylindrical mirror and sub-apertures. (a) Fitting surface of cylindrical mirror; (b) simulated sub-apertures
    Sub-aperture compensation effect. (a)-(d) Residuals between sub-aperture surface and original fitting sub-aperture surface when adding -5°, -2°, 2°, 5° angle errors; (e)-(h) residuals between original fitting sub-aperture surface and sub-aperture surface after angle error compensation
    Fig. 4. Sub-aperture compensation effect. (a)-(d) Residuals between sub-aperture surface and original fitting sub-aperture surface when adding -5°, -2°, 2°, 5° angle errors; (e)-(h) residuals between original fitting sub-aperture surface and sub-aperture surface after angle error compensation
    Simulation of stitching compensation. (a) Original simulation surface; (b) stitching surface after introducing positioning error; (c) stitching surface after positioning error compensation; (d) residuals between original simulation surface and stitching surface after introducing positioning error; (e) residuals between original simulation surface and stitching surface after positioning error compensation
    Fig. 5. Simulation of stitching compensation. (a) Original simulation surface; (b) stitching surface after introducing positioning error; (c) stitching surface after positioning error compensation; (d) residuals between original simulation surface and stitching surface after introducing positioning error; (e) residuals between original simulation surface and stitching surface after positioning error compensation
    Measuring device and tested mirror. (a) 6 inch interferometer; (b) elliptic cylindrical mirror
    Fig. 6. Measuring device and tested mirror. (a) 6 inch interferometer; (b) elliptic cylindrical mirror
    Effect of single sub-aperture compensation. (a) Original sub-aperture S2; (b) sub-aperture after introducing positioning error S2'; (c) sub-aperture after positioning error compensation N2; (d) S2-S2'; (e) S2-N2
    Fig. 7. Effect of single sub-aperture compensation. (a) Original sub-aperture S2; (b) sub-aperture after introducing positioning error S2'; (c) sub-aperture after positioning error compensation N2; (d) S2-S2'; (e) S2-N2
    Effect of full-aperture stitching compensation. (a) Original sub-aperture stitching surface T1; (b) stitching surface after introducing positioning error T2; (c) stitching surface after positioning error compensation T3; (d) T1-T2; (e) T1-T3
    Fig. 8. Effect of full-aperture stitching compensation. (a) Original sub-aperture stitching surface T1; (b) stitching surface after introducing positioning error T2; (c) stitching surface after positioning error compensation T3; (d) T1-T2; (e) T1-T3
    Stitching surface and long trace profiler measurement results. (a) Stitching surface before positioning error compensation; (b) stitching surface after positioning error compensation; (c) center line measured by long trace profiler; (d) residuals between long trace profiler surface and stitching surface before error compensation; (e) residuals between long trace profiler surface and stitching surface after error compensation
    Fig. 9. Stitching surface and long trace profiler measurement results. (a) Stitching surface before positioning error compensation; (b) stitching surface after positioning error compensation; (c) center line measured by long trace profiler; (d) residuals between long trace profiler surface and stitching surface before error compensation; (e) residuals between long trace profiler surface and stitching surface after error compensation
    ParameterValue
    Population scale Np200
    Crossover probability Pc0.5
    Mutation probability Pm0.1
    Iterations G200
    Range of ΔxΔy /pixel[-10,10]
    Range of Δθ /(°)[-5,5]
    Table 1. Key parameters of genetic algorithm
    ParameterValue
    Equationx2a2+y2b2=1
    a300100
    b43.782677
    Center coordinatex0=299900.003191,y0=1.598171
    Table 2. Simulated cylindrical mirror parameters

    Evaluation

    index

    Addition of positioning errorAlgorithm calculation resultsResiduals
    θadd /(°)xadd/pixelyadd /pixelθc /(°)xc/pixelyc /pixelθe /(°)xe/pixelye /pixel
    -500-4.99690.01570.0136-0.0031-0.0157-0.0136
    -411-4.00091.29110.90620.0009-0.29110.0938
    -322-3.00362.03842.00970.0036-0.0384-0.0097
    -233-2.00232.88833.13670.00230.1117-0.1367
    -144-1.00153.71403.97630.00150.28600.0237
    0550.00085.10534.9998-0.0008-0.10530.0002
    1660.99996.13495.97880.0001-0.13490.0212
    2772.00246.87616.9162-0.00240.12390.0838
    3883.00127.92797.9932-0.00120.07210.0068
    4993.99989.14838.96740.0002-0.14830.0326
    510105.000610.34010.1482-0.0006-0.3400-0.1482
    PV0.00670.62600.2420
    RMS0.00190.18300.0732
    Table 3. Addition of positioning error and algorithm estimation results
    Sub-apertureθadd /(°)xadd/pixelyadd /pixel
    Sub-aperture 1000
    Sub-aperture 2322
    Sub-aperture 3232
    Sub-aperture 4533
    Sub-aperture 5213
    Table 4. Position error addition of sub-apertures
    Die Qin, Yongqian Wu, Yan Xu, Shuai Zhang, Ting Deng. Large Angle Positioning Error Correction for Sub-Aperture Stitching Interferometry of Cylindrical X-Ray Mirrors[J]. Laser & Optoelectronics Progress, 2022, 59(17): 1734002
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