• Opto-Electronic Engineering
  • Vol. 38, Issue 1, 107 (2011)
GULGINA Mamtmin*, HAYRENSA Ablat, and ABLIZ Yimit
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    GULGINA Mamtmin, HAYRENSA Ablat, ABLIZ Yimit. In2O3 Thin Film/ Tin-diffused Glass Optical Waveguide Sensor and Its Gas Sensitive Property[J]. Opto-Electronic Engineering, 2011, 38(1): 107 Copy Citation Text show less
    References

    [1] Lukosz. Integrated optical chemical and direct biochemical sensors [J]. Sens.Actuators B(S0925-4005),1995,29:37-50.

    [2] Kiminori Itoh,Hiroshi Nikura,Osamu Odawara,et al. Oprical Wavegui- de properties of virgin microscope slide glass [J].Japeanese Journal of Applied Physics(S0021-4922),1991,30(12A):3416-3418.

    [3] QI Zhi-mei,Itaru Honma,ZHOU Hao-shen. Chemical Gas Sensor Application of Open-Pore Mesoporous Thin Films Based on Integrated Optical Polarimetric Interferometry [J]. Anal. Chem(S0003-2700),2006,78:1034-1041.

    [4] FANG Jun-xin,CAO Qing-qi,YANG Fu-zi. Fundamentals Of Optical waveguide technology physics [M]. Shanghai:Shanghai JiaoTong University Press,1987:2-3.

    [5] Derek Toomre,Dietmar J Manstein. Lighting up the cell surface with evanescentwave microscopy [J]. Tends in Cell Biology(S0962-8924),2001,11(7):298-303.

    [6] JIANG Jie-jian. Fundamentals Of Optoelectronic Physics [M]. Chengdu:University of Electronic Science and Technology of China,1986:2-5.

    [7] ZHOU Zuo-ping,ZHOU Zuo-heng,FAN Shi-liang,et al. Investigation of optical mechanism of sensitive film [J]. Journal of Opto Electronics.Laser,1998,9(2):102-104.

    [8] ZHOU Gong-du,DUAN Lian-yun. Fundamentals of Structural Chemistry [M]. Beijing:Peking University,2002:133-134.

    CLP Journals

    [1] WANG Guan-de, CHEN Bao-xue. Mechanism of Recovery Process of Optical Stopping Effect in As2S8 Waveguide[J]. Opto-Electronic Engineering, 2011, 38(7): 13

    GULGINA Mamtmin, HAYRENSA Ablat, ABLIZ Yimit. In2O3 Thin Film/ Tin-diffused Glass Optical Waveguide Sensor and Its Gas Sensitive Property[J]. Opto-Electronic Engineering, 2011, 38(1): 107
    Download Citation