Test and Study of the Transient Photoconduction of α-CdSe Fast Photodetector

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Journal of Lasers >Volume 21 >Issue 4 >Page 266 > Article

Chinese Journal of Lasers
Vol. 21, Issue 4, 266 (1994)

Test and Study of the Transient Photoconduction of α-CdSe Fast Photodetector

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Test and Study of the Transient Photoconduction of α-CdSe Fast Photodetector[J]. Chinese Journal of Lasers, 1994, 21(4): 266 Copy Citation Text

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Abstract

The authors indicate the effect of deposition conditions on the microarea structure of an α-CdSe film, and investigate the transient photoconduction of an fast photodetector by means of α-CdSe as the photosensitive medium.

Keywords

CdSe film transient photoconduction fast photodetector

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