• Chinese Journal of Lasers
  • Vol. 46, Issue 3, 0303001 (2019)
Jimeng Cheng1、2、*, Lei Wen1, Qinling Zhou1, Jiachuan Ni1, Wei Chen1、*, and Lili Hu1
Author Affiliations
  • 1 R & D Center of High Power Laser Components, Shanghai Institute of Optics and Fine Mechanics, Chineses Academy of Sciences, Shanghai 201800, China;
  • 2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/CJL201946.0303001 Cite this Article Set citation alerts
    Jimeng Cheng, Lei Wen, Qinling Zhou, Jiachuan Ni, Wei Chen, Lili Hu. Electron Probe Micro-Analysis for Platinum Particle Inclusions in Nd∶Glass Before and After Intense Laser Irradiation[J]. Chinese Journal of Lasers, 2019, 46(3): 0303001 Copy Citation Text show less

    Abstract

    The electron probe micro-analyzer (EPMA) technology is used to analyze and study various forms of platinum (Pt) particle inclusions in continuous-smelted Nd∶glass before and after intense laser irradiation. After intense laser irradiation, platinum particle inclusions exhibit three typical EPMA morphology. Their forms come from the joint result of the thermal stress and vapor pressure caused by platinum particles absorbing laser energy. The thermodynamic properties of Nd∶glass also have an effect on the morphology. The phenomenon of Pt-Zr-Sn being co-wrapped is found by comparing the EPMA distribution characteristics of zirconium and stannum impurity inclusions.
    Jimeng Cheng, Lei Wen, Qinling Zhou, Jiachuan Ni, Wei Chen, Lili Hu. Electron Probe Micro-Analysis for Platinum Particle Inclusions in Nd∶Glass Before and After Intense Laser Irradiation[J]. Chinese Journal of Lasers, 2019, 46(3): 0303001
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