• Opto-Electronic Engineering
  • Vol. 30, Issue 3, 62 (2003)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62
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