• Infrared and Laser Engineering
  • Vol. 44, Issue 2, 620 (2015)
Zhang Dongying1、2、*, Yi Weining1, Hong Jin1, and Fang Wei3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    Zhang Dongying, Yi Weining, Hong Jin, Fang Wei. Panchromatic image simulation of Worldview based on low-level flight images[J]. Infrared and Laser Engineering, 2015, 44(2): 620 Copy Citation Text show less
    References

    [1] Gao Yang, Lei Jie, Yu Hong, et al. Technology of simulation for high precision echo laser[J]. Infrared and Laser Engineering, 2012, 41(1): 196-199. (in Chinese)

    [2] Shi Kun, Hao Yingming, Wang Mingming, et al. Real-time simulation method of Infrared sea background[J]. Infrared and Laser Engineering, 2012,41(1): 25-29. (in Chinese)

    [3] Qing Huiping,Yi Weining, Pan Banglong, et al. Simulation of terrain optical remote sensing imaging[J]. Infrared and Laser Engineering, 2011, 40(6): 1177-1180. (in Chinese)

    [4] Borner A, Wiest L. Sensor: a tool for the simulation of hyperspectral remote sensing systems[J]. ISPRS Journal of Photogrammetry and Remote Sensing, 2001, 55(6):299-312.

    [5] Park Stephen K, Schowengerdt Robert, Kaczynski Mary-Anne. Modulation-transfer-function analysis for sampled image systems [J]. Applied Optics, 1984(23): 2572-2582.

    [6] Philip N Slater, Stuart F Biggar, James M Palmer, et al. Unified approach to absolute radiometric calibration in the solar-reflective range[J]. Remote Sensing of Enviroment,2001, 77(3):293-303.

    [7] Keith S Krause. WorldView-1 pre and post-launch radiometric calibration and early on-orbit characterization[C]//SPIE,2008,7081:708116-1-1.

    CLP Journals

    [1] WU Hong-yu, WANG Ling-li, ZHONG Xing, SU Zhi-qiang, CHEN Guan-zhou, BAI Yang. Near-infrared Image Simulation Based on Spectral Correlation Method[J]. Acta Photonica Sinica, 2018, 47(4): 410001

    Zhang Dongying, Yi Weining, Hong Jin, Fang Wei. Panchromatic image simulation of Worldview based on low-level flight images[J]. Infrared and Laser Engineering, 2015, 44(2): 620
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