Measurement of cryogenic thermal expansion coefficient and accuracy analysis

Lei Ni; Baorui Huang; Peilin Li

Journals >Opto-Electronic Engineering >Volume 44 >Issue 10 >Page 1025 > Article

Opto-Electronic Engineering
Vol. 44, Issue 10, 1025 (2017)

Measurement of cryogenic thermal expansion coefficient and accuracy analysis

Lei Ni, Baorui Huang, and Peilin Li

Author Affiliations

Key Laboratory of Testing Technology for Manufacturing Process, Southwest University of Science and Technology, Mianyang 621010, China

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Lei Ni, Baorui Huang, Peilin Li. Measurement of cryogenic thermal expansion coefficient and accuracy analysis[J]. Opto-Electronic Engineering, 2017, 44(10): 1025 Copy Citation Text

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Lei Ni, Baorui Huang, Peilin Li. Measurement of cryogenic thermal expansion coefficient and accuracy analysis[J]. Opto-Electronic Engineering, 2017, 44(10): 1025

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