[1] GJB/Z 89-97,Guide to the circuit tolerance analyses [S].(in Chinese)
[2] SHI J Y,KANG R.Research on method of circuits tolerance analyses based EDA technology [J].Journal of Beijing University of Aeronautics and Astronautics, 2001,27(1):121-124.(in Chinese)
[3] GONG Q X.Handbook of Equipment Reliability Engineering [M].Beijing:National Defense Industry Press, 2007.(in Chinese)
[4] TIAN W, LING X T, LIU R W.Novel methods for circuit worst-case tolerance analysis [J].IEEE Trans.on Circuits and Systems I: Fundamental Theory and Applications,1996(4):272-278.
[5] FEMIA N, SPAGNUOLO G.True worst-case circuit tolerance analysis using genetic algorithm and affine arithmetic[J].IEEE Trans.on Circuits and Systems I: Fundamental Theory and Applications,2000(9):1285-1296.
[6] FEMIA N, SPAGNUOLO G.Genetic optimization of interval arithmetic-based worst-case circuit tolerance analysis[J].IEEE Trans.on Circuits and Systems I: Fundamental Theory and Applications,1999(12):1441-1456.
[8] ZI K M , WU Q W ,GUO J , et al..Thermal design of CCD focal plane assembly of space optical remote-sensor[J].Optical Technique,2008,34(3):401-407.(in Chinese)
[9] LI J H , HAN SH L ,WANG J Q , et al..Thermal analysis and thermal cont rol techniques of space camera[J].Opt.Precision Eng., 1999,7(6):36-41.(in Chinese)
[11] LI Y Z, NING X W, WANG X M, et al..Reliability design and analysis of spacecraft thermal control thermal management system[J].Engineering Science,2007,9(7):53-56.