• Acta Optica Sinica
  • Vol. 33, Issue 5, 505001 (2013)
Yang Zheng*, Zhang Zhiyou, Li Shuhong, Gao Fuhua, and Du Jinglei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos201333.0505001 Cite this Article Set citation alerts
    Yang Zheng, Zhang Zhiyou, Li Shuhong, Gao Fuhua, Du Jinglei. Exposure Developing Simulation Study of Single-Mode-Resonance Interference Lithography[J]. Acta Optica Sinica, 2013, 33(5): 505001 Copy Citation Text show less

    Abstract

    A lithography method based on the single-mode-resonance (SMR) interference in the resist by employing the cylinder grating (CG) coupled structure is proposed. The CG coupled structure is used as a mask, and then the dielectric waveguide can be formed by combining CG with resist layer and substrate. Interference pattern will be generated in the resist using the specific diffraction order (±1) from the CG diffraction. The resist layer plays the role of waveguide which can enhance the light field intensity 25~50 times stronger and greatly improve the light energy utilization ratio. Through simulation, the nanostructure with period smaller than λ/3 and groove width ranging of 42~88 nm (λ/10~λ/5) can be obtained with incident light wavelength of 441 nm.
    Yang Zheng, Zhang Zhiyou, Li Shuhong, Gao Fuhua, Du Jinglei. Exposure Developing Simulation Study of Single-Mode-Resonance Interference Lithography[J]. Acta Optica Sinica, 2013, 33(5): 505001
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