[1] Tang Jinfa, Gu Peifu, Liu Xu, et al. Modern optical thin film technology[M]. Hangzhou: Zhejiang University Press, 2006. (in Chinese)
[2] Wang Duoshu, Xiong Yuqing, Chen Tao, et al. Applications of optical thin film technology in China′s aerospace industry[J]. Journal of Vacuum Science and Technology, 2012, 32(8): 710-716. (in Chinese)
[3] Liu Peng. The theoretic modeling and experimental measurement of the thermo-optic coefficient for germanium-film[D]. Wuhan: Wuhan University of Technology, 2012. (in Chinese)
[4] Li Youlu, Wang Duoshu, Li Kaipeng, et al. Studies on temperature characteristic on refractive index of infrared optical film[J]. Vacuum and Cryogenics, 2015, 21(3): 146-150.
[5] Ye Fan, Gu Bing, Huang Xiaoqin, et al. Development and prospect of refractive-index dispersion of thin films[J]. Optical Instruments, 2010, 32(4): 90-94. (in Chinese)
[6] Bai Shengyuan, Gu Peifu, Liu Xu, et al. Optical stability of thin film filters[J]. Acta Photonica Sinica, 2001, 30(5): 576-580. (in Chinese)
[7] Xiong Yuqing, Li Shaomei, Luo Chongtai, et al. Study on spectral shift of PbTe/ZnS infrared multilayer filters[J]. Optical Technology, 1999, 4: 65-69.
[8] Li Kaipeng, Wang Duoshu, Li Chen, et al. Study on optical thin film parameters measurement method[J]. Infrared and Laser Engineering, 2015, 44(3): 1048-1052. (in Chinese)
[9] Sun Xiangbin, Ren Quan, Yang Hongliang, et al. Several methods of measuring the refractive index of the film[J]. Chinese Journal of Quantum Electronics, 2005, 22(1): 13-18. (in Chinese)