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    Journals >Chinese Journal of Lasers >Volume 20 >Issue 10 >Page 729 > Article
    • Chinese Journal of Lasers
    • Vol. 20, Issue 10, 729 (1993)
    Low-frequency noise spectral density and reliability of semiconductor laser
    [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Low-frequency noise spectral density and reliability of semiconductor laser[J]. Chinese Journal of Lasers, 1993, 20(10): 729 Copy Citation Text show less

    Abstract

    The experimental results of semiconductor lasers about the relations between low-frequency noise spectral density and reliability of devices are reported in this paper.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Low-frequency noise spectral density and reliability of semiconductor laser[J]. Chinese Journal of Lasers, 1993, 20(10): 729
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    Paper Information
    Recommended Topics
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