• Journal of Infrared and Millimeter Waves
  • Vol. 25, Issue 1, 33 (2006)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. EFFECTS OF POWER AGING ON 1/f NOISE CHARACTERISTICS FOR GaAlAs IR LED BAO Jun-Lin ZHUANG Yi-Qi DU Lei MA Zhong-Fa LI Wei-Hua LI Cong[J]. Journal of Infrared and Millimeter Waves, 2006, 25(1): 33 Copy Citation Text show less
    References

    [1] Doru Ursutiu,Brian K Jones.Low-frequency noise used as a lifetime test of LEDs [ J ].Semicond.Sci.Technol.,1996,42(11):1133-1136.

    [3] Chen X Y,Pedersen A,Helleso O G,et al.Electrical noise of laser diodes measured over a wide range of bias currents [ J ].Microelectronics Reliability,2000,40 (6):1925-1928.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. EFFECTS OF POWER AGING ON 1/f NOISE CHARACTERISTICS FOR GaAlAs IR LED BAO Jun-Lin ZHUANG Yi-Qi DU Lei MA Zhong-Fa LI Wei-Hua LI Cong[J]. Journal of Infrared and Millimeter Waves, 2006, 25(1): 33
    Download Citation