Defect Detection of Chip on Carrier Based on Improved YOLOV3

Tianyu Zhou; Qibing Zhu; Min Huang; Guiliang Cai; Xiaoxiang Xu

doi:10.3788/LOP202158.1210002

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 12 >Page 1210002 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 12, 1210002 (2021)

Defect Detection of Chip on Carrier Based on Improved YOLOV3

Tianyu Zhou¹, Qibing Zhu^1、*, Min Huang¹, Guiliang Cai¹, and Xiaoxiang Xu²

Author Affiliations

¹Key Laboratory of Advanced Process Control for Light Industry, Ministry of Education, Jiangnan University, Wuxi, Jiangsu 214122, China

²Wuxi CK Electric Control Equipment Co., Ltd., Wuxi, Jiangsu 214400, China

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DOI: 10.3788/LOP202158.1210002 Cite this Article Set citation alerts

Tianyu Zhou, Qibing Zhu, Min Huang, Guiliang Cai, Xiaoxiang Xu. Defect Detection of Chip on Carrier Based on Improved YOLOV3[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1210002 Copy Citation Text

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Tianyu Zhou, Qibing Zhu, Min Huang, Guiliang Cai, Xiaoxiang Xu. Defect Detection of Chip on Carrier Based on Improved YOLOV3[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1210002

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