Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 19 >Issue 2 >Page 347 > Article
    • Journal of Terahertz Science and Electronic Information Technology
    • Vol. 19, Issue 2, 347 (2021)
    Design of a general test system for integrated circuit Single Event Effect
    YANG Wanwan1、2、*, LIU Hainan1、2, GAO Jiantou1、2, LUO Jiajun1、2, TENG Rui1、2, and HAN Zhengsheng1、2、3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: 10.11805/tkyda2019421 Cite this Article
    YANG Wanwan, LIU Hainan, GAO Jiantou, LUO Jiajun, TENG Rui, HAN Zhengsheng. Design of a general test system for integrated circuit Single Event Effect[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 347 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    YANG Wanwan, LIU Hainan, GAO Jiantou, LUO Jiajun, TENG Rui, HAN Zhengsheng. Design of a general test system for integrated circuit Single Event Effect[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 347
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology