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    Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 19 >Issue 2 >Page 347 > Article
    • Journal of Terahertz Science and Electronic Information Technology
    • Vol. 19, Issue 2, 347 (2021)
    Design of a general test system for integrated circuit Single Event Effect
    YANG Wanwan1,2,*, LIU Hainan1,2, GAO Jiantou1,2, LUO Jiajun1,2..., TENG Rui1,2 and HAN Zhengsheng1,2,3|Show fewer author(s)
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  • 1[in Chinese]
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    DOI: 10.11805/tkyda2019421 Cite this Article
    YANG Wanwan, LIU Hainan, GAO Jiantou, LUO Jiajun, TENG Rui, HAN Zhengsheng. Design of a general test system for integrated circuit Single Event Effect[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 347 Copy Citation Text show less
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    YANG Wanwan, LIU Hainan, GAO Jiantou, LUO Jiajun, TENG Rui, HAN Zhengsheng. Design of a general test system for integrated circuit Single Event Effect[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(2): 347
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