Method for Measurement of Phase Retardation of a Wave Plate Based on Spectral Interference Technology

Wei Wang; Fufang Su; Shang Gao; Dong Liu; Jianzhong Chen

doi:10.3788/LOP212934

Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 1 >Page 0112004 > Article

Laser & Optoelectronics Progress
Vol. 60, Issue 1, 0112004 (2023)

Method for Measurement of Phase Retardation of a Wave Plate Based on Spectral Interference Technology

Wei Wang^1、*, Fufang Su², Shang Gao¹, Dong Liu¹, and Jianzhong Chen¹

Author Affiliations

¹School of Science, Shandong Jiaotong University, Jinan 250357, Shandong, China

²Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, School of Physics and Physical Engineering, Qufu Normal University, Qufu273100, Shandong, China

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DOI: 10.3788/LOP212934 Cite this Article Set citation alerts

Wei Wang, Fufang Su, Shang Gao, Dong Liu, Jianzhong Chen. Method for Measurement of Phase Retardation of a Wave Plate Based on Spectral Interference Technology[J]. Laser & Optoelectronics Progress, 2023, 60(1): 0112004 Copy Citation Text

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Fig. 1. Schematic diagram of optical path

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Theoretical transmittance spectrum curves of a 500-μm-thick quartz wave plate when α=85∘ and θ=40∘

Fig. 2. Theoretical transmittance spectrum curves of a 500-μm-thick quartz wave plate when

α = 85^{\circ}

and

θ = 40^{\circ}

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Fig. 3. Relative relationship of phase retardation of intersection points a₁, a₂, b₂, and b₃ by rotation vector

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Fig. 4. Difference of peak transmittance

T_{m a x}

and valley transmittance

T_{m i n}

dependence on (a)

α

and

θ

and (b) its contour map

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Fig. 5. Schematic diagram of proposed measuring system

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Fig. 6. Measured transmittance spectrum curves in experiment

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$λ_{a} / n m$	$λ_{b} / n m$	$d / μ m$	$δ / r a d$	$n$	$δ_{0} / r a d$	$E_{r} / %$
Average		455.0469	12.9945π	6	0.9945π	1.35
459.83	482.68	454.8837	12.9899π	6	0.9899π	1.01
485.81	511.78	454.8340	12.9885π	6	0.9885π	1.15
508.23	537.08	455.5166	13.0080π	6	1.0080π	0.80
541.08	574.68	455.0638	12.9950π	6	0.9950π	0.50
570.12	608.43	454.4094	12.9763π	6	0.9763π	2.37
613.65	659.92	454.3688	12.9752π	6	0.9752π	2.48
462.66	485.81	455.3674	13.0037π	6	1.0037π	0.37
482.68	508.23	455.3263	13.0025π	6	1.0025π	0.25
511.78	541.08	456.0093	13.0220π	6	1.0220π	2.20
537.08	570.12	454.4981	12.9789π	6	0.9789π	2.11
574.68	613.65	455.6586	13.0120π	6	1.0120π	1.20
608.43	653.65	454.6265	12.9825π	6	0.9825π	1.75

Table 1. Measurement results of a quartz multiple-order 1/2 wave plate at 632.8 nm and computation results

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