• Laser & Optoelectronics Progress
  • Vol. 61, Issue 10, 1011009 (2024)
Xinyue Chai1, Hao Hu1, Xiaoxue Hu1, Xinru Ma1, Sixing Xi2, and Xiaolei Wang1、*
Author Affiliations
  • 1Institute of Modern Optics, College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300350, China
  • 2School of Mathematics and Physics Science and Engineering, Hebei University of Engineering, Handan 056038, Hebei, China
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    DOI: 10.3788/LOP232282 Cite this Article Set citation alerts
    Xinyue Chai, Hao Hu, Xiaoxue Hu, Xinru Ma, Sixing Xi, Xiaolei Wang. Surface Scattering and Imaging Characteristics of Rough Targets in Low-Frequency Terahertz Band[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1011009 Copy Citation Text show less

    Abstract

    Target surface scattering characteristics are the physical basis of terahertz waves used in radar imaging and target recognition and location. The main factors affecting target surface scattering characteristics are the target material and surface roughness. This study uses metal aluminum as an example and fits the Drude model parameters of aluminum at 0.1 THz. Based on the fitting results, the scattering coefficient of a Gaussian random rough aluminum surface is analyzed using Kirchhoff approximation (KA) method. Subsequently, Monte-Carlo rough targets with different roughness are modeled, and the radar scattering cross-section (RCS) is calculated to image the two-dimensional inverse synthetic aperture radar (ISAR). The research results show that the target RCS simulation results are consistent with KA theory analysis, that is, surface roughness is negatively correlated with RCS at a small pitch angle, whereas surface roughness is positively correlated with RCS at a large pitch angle. In addition, in a certain rough range, as the surface roughness increases, the scattering center of the target surface increases, and the ISAR image forms a dense "speckle" effect, which can better reflect the shape and structure of a target.
    Xinyue Chai, Hao Hu, Xiaoxue Hu, Xinru Ma, Sixing Xi, Xiaolei Wang. Surface Scattering and Imaging Characteristics of Rough Targets in Low-Frequency Terahertz Band[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1011009
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