• Acta Optica Sinica
  • Vol. 40, Issue 14, 1424001 (2020)
Yiqin Kuang1、2, Gang Li1、2, Zhuqing Yan1、2, Yanjun Zhang1、2、*, Zhidong Zhang1、2, and Xianwei Hao3
Author Affiliations
  • 1School of Instrument and Electronics, North University of China, Taiyuan, Shanxi 0 30051, China
  • 2Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan, Shanxi 0 30051, China
  • 3Beijing Institute of Aerospace Engineering, Beijing 100000, China
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    DOI: 10.3788/AOS202040.1424001 Cite this Article Set citation alerts
    Yiqin Kuang, Gang Li, Zhuqing Yan, Yanjun Zhang, Zhidong Zhang, Xianwei Hao. Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures[J]. Acta Optica Sinica, 2020, 40(14): 1424001 Copy Citation Text show less
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    Yiqin Kuang, Gang Li, Zhuqing Yan, Yanjun Zhang, Zhidong Zhang, Xianwei Hao. Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures[J]. Acta Optica Sinica, 2020, 40(14): 1424001
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