Excimer Ultraviolet Laser Ablation of C60Films and Its Morphology Analysis

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 15 >Issue 9 >Page 1254 > Article

Acta Optica Sinica
Vol. 15, Issue 9, 1254 (1995)

Excimer Ultraviolet Laser Ablation of C₆₀Films and Its Morphology Analysis

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Excimer Ultraviolet Laser Ablation of C₆₀Films and Its Morphology Analysis[J]. Acta Optica Sinica, 1995, 15(9): 1254 Copy Citation Text

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Abstract

In this paper, experimental study on excimer XeCl (308 nm) ultraviolet laser ablation of C60 films and their morphology analysis are reported. A possible mechanism is presented on the basis of the morphology analysis.

Keywords

laser ablation thin film fullerenes

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