Author Affiliations
1School of Science, Jiangnan University, Wuxi 214122, China2School of Mathematics & Physics Science, Xuzhou University of Technology, Xuzhou 221018, China3State Key Laboratory of Millimeter Waves, Southeast University, Nanjing 210096, Chinashow less
Fig. 1. (a) Schematic of the proposed metallic nanoslit arrays with a top variable dielectric and a CYTOP substrate. (b) Schematic of the fabrication process for the proposed structure.
Fig. 2. (a) Transmission spectrum of the top-layer silica with normal incidence. Magnetic field distributions of the device region at (b) CM2, (c) SPP-CM, and (d) CM1.
Fig. 3. Comparison of the transmission spectra of (a) different top materials and (b) gain-assisted materials (the inset provides a clear picture of the peak position).
Fig. 4. Transmission spectra for incident angles from 5° to 30°. Different color lines denote distinct incident angles. The inset figure shows the schematic structure of the oblique incidence with variable incident angle α. The wavelength of incident light is 1 μm, and the other parameters remain constant.
Fig. 5. (a) Transmission spectra of the first-order CM of the periodic metal structure with different values of period. (b) Transmission intensities as a function of the corresponding wavelength (λ3) and period.
Fig. 6. Simulated transmission spectra of the designed structure with P = 600 nm, D = 460 nm, and different duty cycle values from 0.05 to 0.15.
Fig. 7. (a) Transmission intensity as a function of wavelength (λ3) and slit depth. (b) Wavelength sensitivity of the resonance peak of CM1 and its FOM as functions of depth. Other parameters: normal incidence, P = 600 nm, W= 30 nm, and d = 200 nm.