• Infrared and Laser Engineering
  • Vol. 35, Issue 2, 208 (2006)
[in Chinese]1、2、*, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Chemical structure of HgCdTe-anodic oxide[J]. Infrared and Laser Engineering, 2006, 35(2): 208 Copy Citation Text show less
    References

    [2] GOPAL V,DEVI N,PAL R,et al.Study of the traps at a mercury cadmium telluride-anodic oxide interface using a transient photoconductive decay technique[J].J Cryst Growth,2004,265:530-536.

    [3] PAL R,SHARMA B L,GOPAL V,et al.Effect of HgCdTe-passivant interface properties on the responsivity performance of photoconductive detectors[J].Infrared Phys Technol,1999,40:101-107.

    [4] DAVIS G D,SUN T S,BUCHNER S P,et al.Anodic oxide composition and Hg depletion at the oxide-semiconductor interface of Hg1-xCdxTe[J].J Vac Sci Technol,1981,19(3):472-476.

    [5] ERNE B H,LEFEVRE F,LORANS D,et al.Surface films on HgCdTe and CdTe etched in ferricyanide solution[J].Appl Surf Sci,2001,175-176:579-584.

    [6] BUCHNER S P,DAVIS G D,BYER N E.Summary abstract:photochemical oxidation of (Hg,Cd)Te[J].J Vac Sci Technol,1982,21(2):446-447.

    [7] ARWIN H,ASPNES D E.Nondestructive analysis of Hg1-xCdxTe (x=0.00,0.20,0.29,and 1.00) by spectroscopic ellipsometry 11substrate,oxide,and interface properties[J].J Vac Sci Technol,1984,A2(3):1316-1323.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Chemical structure of HgCdTe-anodic oxide[J]. Infrared and Laser Engineering, 2006, 35(2): 208
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