• Chinese Journal of Lasers
  • Vol. 48, Issue 9, 0904002 (2021)
Peng Feng1、2, Feng Tang1、2、*, Xiangzhao Wang1、2, Yunjun Lu1、2, Jinghao Xu1, Fudong Guo1, and Guoxian Zhang1
Author Affiliations
  • 1Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • show less
    DOI: 10.3788/CJL202148.0904002 Cite this Article Set citation alerts
    Peng Feng, Feng Tang, Xiangzhao Wang, Yunjun Lu, Jinghao Xu, Fudong Guo, Guoxian Zhang. Dual-Hole Point Diffraction Interferometer for Measuring the Wavefront Aberration of an Imaging System[J]. Chinese Journal of Lasers, 2021, 48(9): 0904002 Copy Citation Text show less
    Measuring principle of double-hole point diffraction interferometer
    Fig. 1. Measuring principle of double-hole point diffraction interferometer
    Schematic diagram of system errors calibration. (a) Point diffraction measurement mode;(b) system errors measurement mode
    Fig. 2. Schematic diagram of system errors calibration. (a) Point diffraction measurement mode;(b) system errors measurement mode
    Interference diagrams in DHPDI experiment. (a) System error interferogram; (b) point diffraction interferogram
    Fig. 3. Interference diagrams in DHPDI experiment. (a) System error interferogram; (b) point diffraction interferogram
    Wavefront aberration detection results of the measured objective lens and the 5--37 Zernike polynomials fitting. (a) System error measurement results, 75.66 nm RMS; (b) point diffraction measurement results, 76.92 nm RMS; (c) wave aberration detection results, 8.45 nm RMS
    Fig. 4. Wavefront aberration detection results of the measured objective lens and the 5--37 Zernike polynomials fitting. (a) System error measurement results, 75.66 nm RMS; (b) point diffraction measurement results, 76.92 nm RMS; (c) wave aberration detection results, 8.45 nm RMS
    Interference diagrams in DFPDI experiment. (a) System error measurement results; (b) point diffraction measurement results
    Fig. 5. Interference diagrams in DFPDI experiment. (a) System error measurement results; (b) point diffraction measurement results
    Wavefront aberration detection results of the measured objective lens and the 5--37 Zernike polynomials fitting. (a) System error measurement results, 75.69 nm RMS; (b) point diffraction measurement results, 77.26 nm RMS; (c) wave aberration detection results, 8.52 nm RMS
    Fig. 6. Wavefront aberration detection results of the measured objective lens and the 5--37 Zernike polynomials fitting. (a) System error measurement results, 75.69 nm RMS; (b) point diffraction measurement results, 77.26 nm RMS; (c) wave aberration detection results, 8.52 nm RMS
    Intensity distribution and contrast curve of interferograms of the DHPDI and DFPDI in X direction under two measurement modes. (a) Intensity distribution of two kind of interferograms under the mode of system error measurement; (b) contrast curve of two kind of interferograms under the mode of system error measurement; (c) intensity distribution of two kind of interferograms under the mode of point diffraction measurement; (d) contrast curve of two kind of interferograms under the mode of point diffraction measurement
    Fig. 7. Intensity distribution and contrast curve of interferograms of the DHPDI and DFPDI in X direction under two measurement modes. (a) Intensity distribution of two kind of interferograms under the mode of system error measurement; (b) contrast curve of two kind of interferograms under the mode of system error measurement; (c) intensity distribution of two kind of interferograms under the mode of point diffraction measurement; (d) contrast curve of two kind of interferograms under the mode of point diffraction measurement
    Peng Feng, Feng Tang, Xiangzhao Wang, Yunjun Lu, Jinghao Xu, Fudong Guo, Guoxian Zhang. Dual-Hole Point Diffraction Interferometer for Measuring the Wavefront Aberration of an Imaging System[J]. Chinese Journal of Lasers, 2021, 48(9): 0904002
    Download Citation