Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry

MEI Yan; MA Mi-xia; NIE Zuo-ren

doi:10.3964/j.issn.1000-0593(2013)12-3408-03

Journals >Spectroscopy and Spectral Analysis >Volume 33 >Issue 12 >Page 3408 > Article

Spectroscopy and Spectral Analysis
Vol. 33, Issue 12, 3408 (2013)

Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry

MEI Yan^1、*, MA Mi-xia², and NIE Zuo-ren¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

show less

DOI: 10.3964/j.issn.1000-0593(2013)12-3408-03 Cite this Article

MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408 Copy Citation Text

show less

References

[1] Funahashi M, Kuraoka M, Fujimura S, et al. Advance in X-ray Analysis, 2000, 43: 109.

[2] Parekh N S, Nieuwenhuizen C, Borstrok J J M, et al. Electrochem. Soc., 1991, 138: 1460.

[4] Artz B E, Bomback J L. X-ray Spectrometry, 1982, 11: 51.

[5] Lyman P F, Sakat a O, Marasco D L, et al. Surf. Sci., 2000, 462: L594.

[6] Pootrmans J, Archipov V. Thin Film Solar Cells. New York, USA: John Wiley Sons, 2006. 142.

MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408

Download Citation

Tools

Save the article for my favorites

Paper Information