Liquid Crystal Display Defect Detection Based on Fourier-Mellin Transform

Zhu Bingfei; Chen Wenjian; Li Wusen; Zhang Junqian

doi:10.3788/lop54.121502

[1] Lu R S, Shi Y Q, Li Q, et al. AOI techniques for surface defect inspection［J］. Applied Mechanics and Materials, 2010, 36: 297-302.

[2] Gan Y, Zhao Q. An effective defect inspection method for LCD using active contour model［J］. IEEE Transactions on Instrumentation and Measurement, 2013, 62(9): 2438-2445.

[3] Yun J W, Gu H, Kim D H, et al. Automatic mura inspection using the principal component analysis for the TFT-LCD panel［C］. 1st IEEE International Conference on Consumer Electronics-Taipei, 2014: 109-110.

[4] Fan S, Chuang Y. Automatic detection of Mura defect in TFT-LCD based on regression diagnostics［J］. Pattern Recognition Letters, 2010, 31(5): 2397-2404.

[5] Yang Y B, Li N, Zhang Y. Automatic TFT-LCD mura detection based on image reconstruction and processing［C］. IEEE 3rd International Conference on Consumer Electronics-Berlin, 2013: 240-244.

[6] Mahesh, Subramanyam M V. Automatic feature based image registration using SIFT algorithm［C］. 2012 3rd International Conference on Computing Communication and Networking Technologies-Coimbatore, 2012: 13252223.

[7] Wang S H, You H J, Fu K. BFSIFT: a novel method to find feature matches for SAR image registration［J］. IEEE Geoscience and Remote Sensing Letters, 2012, 9(4): 649-653.

[8] Alcantarilla P F, Bartoli A, Davison A J. KAZE features［C］. IEEE IAS Annual Meeting, 2012: 214-227.

[9] Wang B, Zhang J, Lu L, et al. A uniform SIFT-like algorithm for SAR image registration［J］. IEEE Geoscience and Remote Sensing Letters, 2015, 12(7): 1426-1430.

[10] Huang Yuan, Da Feipeng, Tao Haiji. An automatic registration algorithm for point cloud based on feature extraction［J］. Chinese J Lasers, 2015, 42(3): 0308002.

[11] Wang Canjin, Sun Tao, Wang Rui, et al. Color image registration based on colored binary local invariant descriptor［J］. Chinese J Lasers, 2015, 42(1): 0109001.

[12] Yang Sa, Xia Minghua, Zheng Zhishuo. Medical image registration algorithm based on polynomial deterministic matrix and SIFT transform［J］. Laser & Optoelectronics Progress, 2016, 53(8): 081002.

[13] Zeng Fanxuan, Li Liang, Diao Xinpeng. Iterative closest point algorithm registration based on curvature features［J］.Laser & Optoelectronics Progress, 2017, 54(1): 011003.

[14] Ding Nannan, Liu Yanying, Zhang Ye, et al. Fast image registration based on SURF-DAISY algorithm and randomized kd trees［J］. Journal of Optoelectronics·Laser, 2012, 23(7): 1395-1402.

[15] Wu Yiquan, Tao Feixiang, Cao Zhaoqing. Image registration algorithm based on dual tree complex wavelet transform and SURF［J］. Systems Engineering and Electronics, 2014, 36(5): 997-1003.

[16] Chen Q S, Defrise M, Deconinck F. Symmetric phase-only matched filtering of Fourier-Mellin transforms for image registration and recognition［J］. IEEE Transctions on Pattern Analysis and Machine Intelligence, 1994, 16(12): 1156-1168.

[17] Hutchison L A D, Barrett W A. Fast registration of tabular document images using the Fourier-Mellin transform［C］. 1st International Workshop on Document Image Analysis for Libraries, 2004: 253.

[18] Lu Yongfang, Lu Ke, Hou Xiangwen. Research on Image Fusion Based on the IHS Transform［J］. Bulletin of Science and Technology, 2012, 28(6): 212-214.