• Laser & Optoelectronics Progress
  • Vol. 54, Issue 1, 11202 (2017)
Bian Xintian1、2、*, Cheng Ju1、2, Zuo Fen2, Lei Feng2, and Zhang Enze1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop54.011202 Cite this Article Set citation alerts
    Bian Xintian, Cheng Ju, Zuo Fen, Lei Feng, Zhang Enze. A Method of 3D Shape Measurement Based on Alignment Grating Projection[J]. Laser & Optoelectronics Progress, 2017, 54(1): 11202 Copy Citation Text show less
    References

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    [11] Tian Ailing, Jiang Zhuangde, Huang Mengtao, et al. New method of three-dimensional profile measurement based on fringe pattern projection[J]. Journal of Xi′an Jiaotong University, 2004, 38(9): 959-962.

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    Bian Xintian, Cheng Ju, Zuo Fen, Lei Feng, Zhang Enze. A Method of 3D Shape Measurement Based on Alignment Grating Projection[J]. Laser & Optoelectronics Progress, 2017, 54(1): 11202
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