• Laser & Optoelectronics Progress
  • Vol. 56, Issue 10, 100002 (2019)
Jinzhan Chen1、2, Handing Xia1、*, Rongguo Lu2, Xiaoyan Zhou1, Zhaohua Shi1, Yingjuan Zhang1, Zhiqing Wu1, Xin Ye1, Jin Huang1, Weidong Wu1, and Bo Li1
Author Affiliations
  • 1 Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
  • 2 School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
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    DOI: 10.3788/LOP56.100002 Cite this Article Set citation alerts
    Jinzhan Chen, Handing Xia, Rongguo Lu, Xiaoyan Zhou, Zhaohua Shi, Yingjuan Zhang, Zhiqing Wu, Xin Ye, Jin Huang, Weidong Wu, Bo Li. Physical Methods for Diagnosing Photodarkening Performance of Yb-Doped Fibers[J]. Laser & Optoelectronics Progress, 2019, 56(10): 100002 Copy Citation Text show less

    Abstract

    The photodarkening effect is a crucial factor that influences the stability, reliability, and lifetime of the high-power Yb-doped fiber lasers. The accurate physical characterization and diagnosis of the photodarkening performance of the Yb-doped fibers are the premise and basis for understanding the photodarkening mechanisms and for establishing the photodarkening elimination technologies. This study introduces the main physical parameters of the photodarkening performance. Further, the physical diagnosis methods used to assess the photodarkening performance are also reviewed. Additionally, the advantages, disadvantages, and application scopes of these methods are analyzed. The major factors influencing the photodarkening performance are subsequently discussed. Finally, the research development trend of the physical diagnosis methods is briefly discussed with respect to the photodarkening performance of the Yb-doped fibers.
    Jinzhan Chen, Handing Xia, Rongguo Lu, Xiaoyan Zhou, Zhaohua Shi, Yingjuan Zhang, Zhiqing Wu, Xin Ye, Jin Huang, Weidong Wu, Bo Li. Physical Methods for Diagnosing Photodarkening Performance of Yb-Doped Fibers[J]. Laser & Optoelectronics Progress, 2019, 56(10): 100002
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