• Infrared and Laser Engineering
  • Vol. 34, Issue 1, 66 (2005)
[in Chinese]1、2、3、4、*, [in Chinese]1、2、3、4, and [in Chinese]1、2、3、4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Calculation stellardetection limit for active pixel sensor[J]. Infrared and Laser Engineering, 2005, 34(1): 66 Copy Citation Text show less
    References

    [1] Liebe C C;Alkalai L;Domingo G.Micro APS based star tracker[A].IEEE Aerospace Conference Proceeding[C].2002; 5.2285-2300.

    [2] Kim H Y;Junkins J L.Self-organizing guide star selection algoriorithm for star trackers:thinning method[A].IEEE Proceedings of Aerospace Conference[C]. 2002; 5.2276-2283.

    [3] Tian Hui;Fowler B ;Gamal A E.Analysis of temporal noise in CM OS APS[A]. Processing of SPIE[C]. 1999;3649.177-185.

    [4] Fossum E R; Bartman R K; Eisenman A R. Application of the active pixel sensor concept to guidance and navigation[A]. Proc SPIE[C]. 1993;1949.256-265.

    [5] Waldman G;Wootton J.Electro-Optical Systems Performance Modeling[M]. Nordwood; MA: Artech House; 1993.

    [6] Serway R A;Beichner R.Physics for scientists and engineers with modern physics[M]. New York: Harcourt; 2000.

    [7] Martinez P; Kloz A. A Practical Guide to CCD Astronomy[M].Cambridge UK:CUP; 1998.

    [8] Liebe C C;Dennison E W;Hancock B. Active pixel sensor(APS)based star tracker[A]. Processings of IEEE Aerospace Conference [C].2002; 5. 2285-2300.

    [9] Fossum E R.CMOS image sensor:electronic Camera-on-Chip[J].IEEE Trans on Electron Devices; 1997;44 (10): 1689-1698.

    [10] Tian H;Flower B;Gamal A E.Analysis of temporal noise in APS [A]. Processing of SPIE[C].1999;3649.177-185.

    [11] Hancock B R;Stirbl R C;Cunningham T J. CMOS active pixel sensor specific performance effects on star tracker/imager position accuracy [A].SPIE [C].2001;4284.44-47.

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    [in Chinese], [in Chinese], [in Chinese]. Calculation stellardetection limit for active pixel sensor[J]. Infrared and Laser Engineering, 2005, 34(1): 66
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