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    Journals >Journal of Terahertz Science and Electronic Information Technology >Volume 19 >Issue 3 >Page 537 > Article
    • Journal of Terahertz Science and Electronic Information Technology
    • Vol. 19, Issue 3, 537 (2021)
    Design of an integrated circuit function test system based on V58300 platform
    TIANQiang1、2、3, YANG Wanwan2、3、*, LI Linan1, GUO Gang4、5, CAI Li4、5, LIU Hainan2、3, and LUO Jiajun2、3
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  • 1[in Chinese]
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    DOI: 10.11805/tkyda2019422 Cite this Article
    TIANQiang, YANG Wanwan, LI Linan, GUO Gang, CAI Li, LIU Hainan, LUO Jiajun. Design of an integrated circuit function test system based on V58300 platform[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(3): 537 Copy Citation Text show less
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    TIANQiang, YANG Wanwan, LI Linan, GUO Gang, CAI Li, LIU Hainan, LUO Jiajun. Design of an integrated circuit function test system based on V58300 platform[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(3): 537
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