Based on the V58300 hardware platform independently developed by the Institute of Microelectronics of the Chinese Academy of Sciences, an integrated circuit function test system is designed and implemented. The system includes two parts: host computer and slave computer. By changing the definition of the I/O related to the test system and the input test vector file in real time on the host computer, the functions test of Dual In-line Packaged(DIP) integrated circuits with various operating frequencies of 25 MHz and below and I/O numbers of 48 and below can be automatically completed. The system realizes the universalization and low cost of the test system. Finally, it is proved that the test system can effectively test related chips by experiments.