• Laser & Optoelectronics Progress
  • Vol. 61, Issue 10, 1012003 (2024)
Chunjian Hua1、2、*, Mingchun Sun1、2, Yi Jiang1、2, Jianfeng Yu1、2, and Ying Chen3
Author Affiliations
  • 1School of Mechanical Engineering, Jiangnan University, Wuxi 214122, Jiangsu , China
  • 2Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment & Technology, Wuxi 214122, Jiangsu , China
  • 3School of Internet of Things Engineering, Jiangnan University, Wuxi 214122, Jiangsu , China
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    DOI: 10.3788/LOP231895 Cite this Article Set citation alerts
    Chunjian Hua, Mingchun Sun, Yi Jiang, Jianfeng Yu, Ying Chen. Multispectral Apple Surface Defect Detection Based on Improved YOLOv7-tiny[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012003 Copy Citation Text show less

    Abstract

    A defect detection model based on improved YOLOv7-tiny is proposed herein to address the problem of different detection methods for different defects on apple surface. Combined with RGB+NIR multispectral images collected by a camera, various defects on the apple surface are detected and classified. First, to extract more effective feature information and improve the ability to locate defects, coordinate attention (CA) is used to aggregate coordinate information in the backbone network, and a contextual transformer (CoT) module is added behind the backbone network to increase the global receptive field. Second, it is combined with the weighted bidirectional feature pyramid to adjust the proportion of each branch in the structure to enhance the feature fusion ability of efficient layer aggregation networks. Finally, the loss function is replaced by Focal-EIoU loss to solve the problem of unbalanced samples. The mean average precision (mAP) @0.5 of the improved network increases by 1.2 percentage points to 93.2%, and the recognition speed is 89.3 frames/s. The research content of this paper provides a more efficient method for apple surface defect detection and a more accurate basis for apple grading.
    Chunjian Hua, Mingchun Sun, Yi Jiang, Jianfeng Yu, Ying Chen. Multispectral Apple Surface Defect Detection Based on Improved YOLOv7-tiny[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012003
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