Author Affiliations
1Key Laboratory of Manufacturing Equipment of Shaanxi Province, Xi'an University of Technology, Xi'an 710048, Shaanxi, China2State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, Chinashow less
Fig. 1. Schematic diagram of the SLS process of the multitrack-multilayer part
Fig. 2. 4-beams SLS forming system and the infrared thermal imager. (a) FLIR A615 infrared thermal imager; (b) SLS forming system; (c) ceiling of the forming cabin
Fig. 3. SLS temperature field simulation image with the process parameters of the group 10
Fig. 4. Detected images of sintering points temperatures with the process parameters of the group 10
Fig. 5. SLS temperature field simulation image with the process parameters of the group 18
Fig. 6. Detected images of sintering points temperatures with the process parameters of the group 18
Fig. 7. Schematic diagram of sintering points temperatures prediction model based on neural network
Fig. 8. Algorithm flow of BP neural network optimized by GA
Fig. 9. Testing sample errors of the GA-BP neural network
Fig. 10. Interface of sintering points temperatures prediction software
Fig. 11. Design model of the thin cuboid
Fig. 12. Comparison of predicted and detected sintering points temperatures of part 1. (a) Predicted temperatures; (b) detected temperatures
Fig. 13. Comparison of predicted and detected sintering points temperatures of part 2. (a) Predicted temperatures; (b) detected temperatures
No. | Laser power /W | Scan speed /(m·s-1) | Powder layer thickness /mm | No. | Laser power /W | Scan speed /(m·s-1) | Powder layer thickness /mm |
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1 | 45 | 0.1 | 0.15 | 19 | 41 | 0.3 | 0.15 | 2 | 50 | 0.1 | 0.15 | 20 | 47 | 0.3 | 0.15 | 3 | 58 | 0.1 | 0.15 | 21 | 50 | 0.3 | 0.25 | 4 | 40 | 0.1 | 0.20 | 22 | 57 | 0.3 | 0.25 | 5 | 45 | 0.1 | 0.20 | 23 | 60 | 0.3 | 0.25 | 6 | 50 | 0.1 | 0.20 | 24 | 50 | 0.3 | 0.30 | 7 | 45 | 0.1 | 0.30 | 25 | 55 | 0.3 | 0.30 | 8 | 50 | 0.1 | 0.30 | 26 | 65 | 0.3 | 0.30 | 9 | 55 | 0.1 | 0.30 | 27 | 36 | 0.4 | 0.15 | 10 | 50 | 0.2 | 0.20 | 28 | 42 | 0.4 | 0.15 | 11 | 55 | 0.2 | 0.20 | 29 | 45 | 0.4 | 0.15 | 12 | 60 | 0.2 | 0.20 | 30 | 45 | 0.4 | 0.25 | 13 | 48 | 0.2 | 0.25 | 31 | 50 | 0.4 | 0.25 | 14 | 55 | 0.2 | 0.25 | 32 | 58 | 0.4 | 0.25 | 15 | 65 | 0.2 | 0.25 | 33 | 44 | 0.4 | 0.30 | 16 | 40 | 0.2 | 0.30 | 34 | 48 | 0.4 | 0.30 | 17 | 45 | 0.2 | 0.30 | 35 | 55 | 0.4 | 0.30 | 18 | 35 | 0.3 | 0.15 | | | | |
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Table 1. Process parameters of the simulation experiments
Parameter | Value |
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Temperature range of the objects /℃ | -40-650 | Image frequency /Hz | 50 | Infrared resolution /(pixel×pixel) | 640×480 | Operating temperature range /℃ | -15-50 | Accuracy /℃ | ±2(or ±2% of the readings) | Field angle /[(°)×(°)] | 80×64.4 |
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Table 2. Technical parameters of the FLIR A615 infrared thermal imager