Method for Evaluating Spectral Similarity Based on First-Order Gradient Information

LIU Shi-jie; LI Chun-lai; XU Rui; TANG Guo-liang; XU Yan; WU Bing; WANG Jian-yu

doi:10.3964/j.issn.1000-0593(2021)03-0776-06

Journals >Spectroscopy and Spectral Analysis >Volume 41 >Issue 3 >Page 776 > Article

Spectroscopy and Spectral Analysis
Vol. 41, Issue 3, 776 (2021)

Method for Evaluating Spectral Similarity Based on First-Order Gradient Information

LIU Shi-jie^1、2、*, LI Chun-lai^1、3, XU Rui¹, TANG Guo-liang^1、2, XU Yan^1、2、4, WU Bing^1、2, and WANG Jian-yu^1、2、3

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

⁴[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2021)03-0776-06 Cite this Article

LIU Shi-jie, LI Chun-lai, XU Rui, TANG Guo-liang, XU Yan, WU Bing, WANG Jian-yu. Method for Evaluating Spectral Similarity Based on First-Order Gradient Information[J]. Spectroscopy and Spectral Analysis, 2021, 41(3): 776 Copy Citation Text

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References

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[3] Padma S, Sanjeevi S. International Journal of Applied Earth Observation and Geoinformation, 2014, 32: 138.

[4] Nidamanuri R, Zbell B. Selected Topics in Applied Earth Observations and Remote Sensing, IEEE, 2011, 4(1): 226.

[6] Qaisar S, Bilal R M, Iqbal W, et al. Journal of Communication and Networks, 2013, 15(5): 443.

[8] Ma D, Liu J, Huang J, et al. Sensors, 2016, 16(152): 1.

CLP Journals

[1] XU Yan, LI Chunlai, LIU Shijie, TANG Guoliang, XIE Jianan, WANG Jianyu. Simulation and Verification of Uniformly Distributed-slit Array Coded Spectral Imaging System[J]. Semiconductor Optoelectronics, 2021, 42(4): 562

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