[3] Tam H Y, Cheng H B, Wang Y W. J. Mater. Process. Technol., 2007. 192-193： 277.
[4] Rodolfo J. Proc. of SPIE, 2008, 7018： 70180E-1.
[5] Breysse J, Castel D, Laviron B, et al. All-SiC Telescope Technology: Recent Progress and Achievements. Proceedings of the 5th International Conference on Space Optics, Toulouse, France, 2004. 649.
[10] Toshiki Kaneko, Masatoshi Wakagi, Ken-ichi Onisawa, et al. Appl. Phys. Lett., 1994; 64(14): 1865.
[11] Richter H, Wang Z P, Ley L. Solid State Communication, 1981, 39： 625.
[12] Honea E C, Ogura A, Murray C A, et al. Nature, 1993, 366： 42.
[13] Honea E C, Ogura A, Peale D R, et al. J. of Chem. Phys., 1999, 110(24): 12161.
[14] Hadjadj A, Beorchia A, Roca i Cabarrocas P, et al. J. Phys. D: Appl. Phys., 2001, 34: 690.
[15] Chan Kah-yoong, Teo Bee-san. Microelectronics J., 2006, 37： 1064.
[16] Kun Ho Kim, Ki Cheol Park, Dae Young Ma. Journal of Appl. Phys., 1997, 81(12)： 7764.
