Fabrication and Surface Enhanced Raman Spectroscopy of Nano-Cu2O Thin Films

Jinxia Wang; Ruijin Hong; Chunxian Tao; Dawei Zhang

doi:10.3788/AOS201737.0816004

Journals >Acta Optica Sinica >Volume 37 >Issue 8 >Page 0816004 > Article

Acta Optica Sinica
Vol. 37, Issue 8, 0816004 (2017)

Fabrication and Surface Enhanced Raman Spectroscopy of Nano-Cu₂O Thin Films

Jinxia Wang^1、*, Ruijin Hong^1、2, Chunxian Tao^1、2, and Dawei Zhang^1、2

Author Affiliations

¹ School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

² Research Center of Optical Instruments and Systems Engineering, Ministry of Education, Shanghai Key Laboraory of Modern Optical System, Shanghai 200093, China

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DOI: 10.3788/AOS201737.0816004 Cite this Article Set citation alerts

Jinxia Wang, Ruijin Hong, Chunxian Tao, Dawei Zhang. Fabrication and Surface Enhanced Raman Spectroscopy of Nano-Cu₂O Thin Films[J]. Acta Optica Sinica, 2017, 37(8): 0816004 Copy Citation Text

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Fig. 1. Structural diagram of experiment

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Fig. 2. XRD patterns of nano-Cu2O thin films under annealing temperature of 200 ℃

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Fig. 3. XPS patterns of nano-Cu2O thin films. (a) Cu 2p; (b) O 1s

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Fig. 4. Absorption spectra of nano-Cu2O thin films

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Fig. 5. SERS spectra of Rhodamine B molecules in nano-Cu2O thin films

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Parameter	S1	S2	S3	S4	S5	S6
Thickness of sample /nm	10	20	30	40	50	100
Annealing temperature /℃	200	200	200	200	200	200
Annealing time /min	60	60	60	60	60	60

Table 1. Experimental paramenters

Jinxia Wang, Ruijin Hong, Chunxian Tao, Dawei Zhang. Fabrication and Surface Enhanced Raman Spectroscopy of Nano-Cu₂O Thin Films[J]. Acta Optica Sinica, 2017, 37(8): 0816004

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