• Acta Optica Sinica
  • Vol. 29, Issue 2, 529 (2009)
Ran Junxia1、*, Zhang Shaopeng2, Li Honglian3, Hao Xiaohui1, and Pang Xuexia1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Ran Junxia, Zhang Shaopeng, Li Honglian, Hao Xiaohui, Pang Xuexia. Stark Broadening Spectral Line Profile at Different Electric Microfield Distribution Functions[J]. Acta Optica Sinica, 2009, 29(2): 529 Copy Citation Text show less

    Abstract

    The Stark broadening spectral line profile is described at different electric microfield distribution functions. According to Stark broadening theory, Stark broadening spectral line profile is asymmetry in essence considering plasma ions impact. The electric microfield distribution function is very important for the spectral line profile. The results show that the Stark broadening spectral line profile is similar at the Holtsmark distribution and Nearest-Neighbor field distribution and it is diversification at Mayer model. With the decreasing of the electrons impact broadening parameter, the influences of different electric microfield distribution functions are diminished. With the decreasing of the plasma ions impact parameter, the influences of different electric microfield distribution functions are trailing off. The results also show that the action of electric microfield distribution functions is similar when the plasma ions impact parameter is very small. It is illuminated that the plasma ions intense impact has great influence on the spectral line profile.
    Ran Junxia, Zhang Shaopeng, Li Honglian, Hao Xiaohui, Pang Xuexia. Stark Broadening Spectral Line Profile at Different Electric Microfield Distribution Functions[J]. Acta Optica Sinica, 2009, 29(2): 529
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