• Opto-Electronic Engineering
  • Vol. 37, Issue 4, 83 (2010)
ZHONG Xing1,*, LIU Chun-yu1,2, and JIN Guang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2010.04.016 Cite this Article
    ZHONG Xing, LIU Chun-yu, JIN Guang. Slab Compensated Auto-collimation Method to Test Primary Mirror of TMC System[J]. Opto-Electronic Engineering, 2010, 37(4): 83 Copy Citation Text show less
    References

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    [3] Lampton M,Sholl M. Comparison of on-axis three mirror anastigmatic telescopes [J]. Proc. of SPIE(S0277-786X),2007,6687:1-8.

    [4] Mallik Proteep C V,Zehnder Rene,Burge James H. Absolute calibration of null correctors using dual computer- generated holograms [J]. Proc. of SPIE(S0277-786X),2007,6721:1-16.

    [5] Zehnder Rene,Burge James H,Zhao Chunyu. Use of computer generated holograms for alignment of complex null correctors [J]. Proc. of SPIE(S0277-786X),2006,6273:1-8.

    [6] GUO Pei-ji,YU Jing-chi. Improving precision of null lens method with correction technique [J]. Optics and Precision Engineering,2006,14(2):202-206.

    [7] GUO Pei-ji,YU Jing-chi. Some problems about compensator designing [J]. Optical technique,2006,32(1):118-120.

    [8] PAN Jun-hua. Design, Machining and Testing of Optical Aspheric Surface [M]. Beijing:Beijing Science and Technology Press,1994.

    [9] ZHONG Xing,JIN Guang,WANG Dong,et al. Influence of surface irregularity of on-axis TMA mirror on wave-front error [J]. Optics and Precision Engineering,2008,16(8):1516-1520

    CLP Journals

    [1] MING Ming, YANG Fei, CHEN Bao-gang, LI Jian-feng, LIN Xu-dong. The Mistake during the Process of Testing Aspheric Mirror Using Compensator[J]. Opto-Electronic Engineering, 2010, 37(10): 116

    [2] MING Ming, YANG Fei, CHEN Bao-gang, LI Jian-feng, LIN Xu-dong. The Mistake during the Process of Testing Aspheric Mirror Using Compensator[J]. Opto-Electronic Engineering, 2010, 37(10): 116

    ZHONG Xing, LIU Chun-yu, JIN Guang. Slab Compensated Auto-collimation Method to Test Primary Mirror of TMC System[J]. Opto-Electronic Engineering, 2010, 37(4): 83
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