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Journals >Opto-Electronic Engineering >Volume 32 >Issue 5 >Page 55 > Article

Opto-Electronic Engineering
Vol. 32, Issue 5, 55 (2005)

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(5): 55 Copy Citation Text

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References

[5] Edward P LYVERS, Owen Robert MITCHELL, Mark L AKEY, et al. Subpixel measurements using a moment-based edge operator[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1989, 11 (12): 1293-1307.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(5): 55

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