Influence of Reflection-Induced Phase Retardation Upon the Immunity to Electromagnetic Interference ob Bluk-Glass Optic-Current Sensors

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 18 >Issue 9 >Page 1249 > Article

Acta Optica Sinica
Vol. 18, Issue 9, 1249 (1998)

Influence of Reflection-Induced Phase Retardation Upon the Immunity to Electromagnetic Interference ob Bluk-Glass Optic-Current Sensors

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]², [in Chinese]², and [in Chinese]²

Author Affiliations

¹[in Chinese]

²Department of E.E.I.E., City University, London, ECIV OHB, U.K.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Influence of Reflection-Induced Phase Retardation Upon the Immunity to Electromagnetic Interference ob Bluk-Glass Optic-Current Sensors[J]. Acta Optica Sinica, 1998, 18(9): 1249 Copy Citation Text

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Abstract

Reflection induced phase retardation (RPR) on light turning points of bulk glass optic current sensors would influence the immunity to electromagnetic interference of the sensors. The theoretic analysis, results of numerical simulation and experiments are presented.

Keywords

electromagnetic interference （EMI）.reflection induced phase retardation optic current sensor （OCS）

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