[2] DEMIRYONT H ,SITES J R ,GEIB K .Effects of oxygen content on the properties of tantalum oxide films deposited by ion beam sputtering [J]. Appl, Opt, 1985, 24: 490-495.
[2] DEMIRYONT H ,SITES J R ,GEIB K .Effects of oxygen content on the properties of tantalum oxide films deposited by ion beam sputtering [J]. Appl, Opt, 1985, 24: 490-495.
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