[1] S S Gorthi, P Rastogi. Fringe Projection Techniques: Whither we are [J]. Opt Laser Eng, 2010, 48(2): 133-140.
[2] M C Knauer, J Kaminski, G Hausler. Phase measuring deflectometry: a new approach to measure specular free- form surfaces [C]. SPIE, 2004, 5869: 355-366.
[3] T Bothe, W Li, C von Kopylow, et al.. High-resolution 3D shape measurement on specular surfaces by fringe reflection [C]. SPIE, 2004, 5457: 411-422.
[4] V Srinivasan, H C Liu, M Halioua. Automated phase-measuring profilometry of 3-D diffuse objects [J]. Appl Opt, 1984, 23(18): 3105-3108.
[5] Z Wang, H Du, S Park, et al.. Three-dimensional shape measurement with a fast and accurate approach [J]. Appl Opt, 2009, 48(6): 1052-1061.
[6] Liu yan. Research and Improvement of Grating projection 3D Surface Profile Measurement Method [D]. Nanjing: Nanjing University of Aeronautics and Astronautics, 2007.
[7] Tan Huazhu, Zhao Huijie. Application of noise- immune phase unwrapping algorithm on projecting fringe method of measuring the 3D topography [J]. J Astronautic Metrology and Measurement, 2002, 22(2):14-19.
[8] Wang Xin, Jia Shuhai, Chen Guangde. A review of the study on phase unwrapping [J]. Chinese J Scientific Instrument, 2005, 26(8): 665-668.
[9] Jiang Liping. Digital Logic Circuits and System Design [M]. Beijing: Electronic Industry Press, 2008: 10-11.
[10] M Petz, R Ritter. Reflection grating method for 3D measurement of reflecting surfaces [C]. SPIE, 2001, 4399: 38-39.