A Method for Measuring Characteristics of Broadband Spectral Response

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 29 >Issue 1 >Page 48 > Article

Opto-Electronic Engineering
Vol. 29, Issue 1, 48 (2002)

A Method for Measuring Characteristics of Broadband Spectral Response

[in Chinese]¹, [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. A Method for Measuring Characteristics of Broadband Spectral Response[J]. Opto-Electronic Engineering, 2002, 29(1): 48 Copy Citation Text

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References

[2] Ajoy Ghatak,Thyagarajan K.Optical electronics[M].Cambridge:Cambridge University Press,1989.

[6] Larason T C,Bruce S S,Parr A C.NIST measurement services:spectroradiometric detector measurements:PartsⅠand Ⅱ-Ultraviolet and visible to near infrared detectors[S].New York:Natl.Inst.Stand.Tech.(U.S.) Spec.Publ,1997,250-41.

[8] Riccardo Vanzetti.Practical applications of infrared techniques[M].New York:John Wiley & Sons,1972.

[9] Roger Phillips.Sources and applications of ultraviolet radiation[M].London:Academic Press Inc,Ltd,1983.

[in Chinese], [in Chinese], [in Chinese]. A Method for Measuring Characteristics of Broadband Spectral Response[J]. Opto-Electronic Engineering, 2002, 29(1): 48

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