• Infrared and Laser Engineering
  • Vol. 50, Issue 11, 20210453 (2021)
Shuai Wang1、2, Qin Han1、2、3、*, Han Ye1、2, Liyan Geng1、2, Ziqing Lu1、2, Feng Xiao1、2, and Fan Xiao1、2
Author Affiliations
  • 1State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • show less
    DOI: 10.3788/IRLA20210453 Cite this Article
    Shuai Wang, Qin Han, Han Ye, Liyan Geng, Ziqing Lu, Feng Xiao, Fan Xiao. Temperature dependency of InGaAs/InP single photon avalanche diode for 1 550 nm photons[J]. Infrared and Laser Engineering, 2021, 50(11): 20210453 Copy Citation Text show less
    Cross-section of the SPAD structure and its internal electric field distribution
    Fig. 1. Cross-section of the SPAD structure and its internal electric field distribution
    (a) Dark current and photocurrent at 1 550 nm as a function of bias voltage for SPAD at temperature of 223-293 K;(b) Breakdown voltage versus temperature data (symbols) and linear fitting (line)
    Fig. 2. (a) Dark current and photocurrent at 1 550 nm as a function of bias voltage for SPAD at temperature of 223-293 K;(b) Breakdown voltage versus temperature data (symbols) and linear fitting (line)
    Temperature dependence of PDE and DCR of 25 μm diameter SPADs (color online)
    Fig. 3. Temperature dependence of PDE and DCR of 25 μm diameter SPADs (color online)
    Activation energies of DCR at 2 V excess bias
    Fig. 4. Activation energies of DCR at 2 V excess bias
    PDE and DCR dependence on excess bias of 25 μm-diameter SPAD at 223 K
    Fig. 5. PDE and DCR dependence on excess bias of 25 μm-diameter SPAD at 223 K
    Relationship between APP and the operate temperature at 2 V excess bias
    Fig. 6. Relationship between APP and the operate temperature at 2 V excess bias
    Shuai Wang, Qin Han, Han Ye, Liyan Geng, Ziqing Lu, Feng Xiao, Fan Xiao. Temperature dependency of InGaAs/InP single photon avalanche diode for 1 550 nm photons[J]. Infrared and Laser Engineering, 2021, 50(11): 20210453
    Download Citation