Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors

Jing-fei WANG; Yan-guan CHEN

doi:10.3969/j.issn.1672-8785.2023.12.004

Journals >INFRARED >Volume 44 >Issue 12 >Page 24 > Article

INFRARED
Vol. 44, Issue 12, 24 (2023)

Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors

Jing-fei WANG and Yan-guan CHEN

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[in Chinese]

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DOI: 10.3969/j.issn.1672-8785.2023.12.004 Cite this Article

WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24 Copy Citation Text

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References

[2] Norton P R. Third-generation Sensors for Night Vision \[J\]. Opto-Electron, 2006, 14(2): 283-296.

[7] Zhang L S，Feng Y H，Zhao Hao．Application of Pixel-level Digital Integration in Space Infrared Remote Sensing \[C\]. Beijing: International Symposium on Optoelectronic Technology and Application, 2018.

[8] Kenneth I S，Michael W K，Justin J．Digital-pixel Focal Plane Array Technology \[J\]. Lincoln Laboratory Journal, 2014, 20(2): 36-51.

WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24

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