• INFRARED
  • Vol. 44, Issue 12, 24 (2023)
Jing-fei WANG and Yan-guan CHEN
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1672-8785.2023.12.004 Cite this Article
    WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24 Copy Citation Text show less

    Abstract

    Infrared detectors are the core components of infrared systems. In recent years, high sensitivity and low noise have become one of the research hotspots in infrared detector technology. For low-noise detectors with noise equivalent temperature difference (NETD) value less than 1 mK, the impact of environmental factors on their performance can not be ignored. The influence of test environment on the test results of sub-mK infrared detectors was analyzed from the aspects of blackbody temperature control accuracy, test environment temperature and airflow disturbance in the test environment. The test methods of low-noise infrared detectors were explored. The experimental results show that the accuracy of blackbody temperature control has a direct impact on the NETD value of high-sensitivity infrared detectors. The test environment temperature and airflow disturbance can affect the stability of blackbody temperature control, thereby indirectly affecting the accuracy of NETD value measurement.
    WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24
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